The balance in the museumROBENS, E; KIEFER, S.Journal of thermal analysis and calorimetry. 2010, Vol 101, Num 2, pp 769-773, issn 1388-6150, 5 p.Conference Paper

A resonance measuring wire tension monitor for high-energy physicsSTANLEY DURKIN, L; FISHER, D; LENNOUS, P et al.IEEE transactions on nuclear science. 1995, Vol 42, Num 4, pp 1419-1424, issn 0018-9499, 2Article

Fundamentals of mass measurementsMECEA, V. M.Journal of thermal analysis and calorimetry. 2006, Vol 86, Num 1, pp 9-16, issn 1388-6150, 8 p.Conference Paper

GaPO₄ high temperature crystal microbalance with zero temperature coefficientTHANNER, H; KREMPL, P. W; WALLNÖFER, W et al.Vacuum. 2002, Vol 67, Num 3-4, pp 687-691, issn 0042-207X, 5 p.Conference Paper

Development and application of mass sensors based on flexural resonances in alumina beams : Special issue on ApplicationsFERRARI, V; MARIOLI, D; TARONI, A et al.IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 1996, Vol 43, Num 4, pp 601-608, issn 0885-3010Article

The characterization of the capability of a balanceROBENS, E.Journal of thermal analysis. 1996, Vol 47, Num 2, pp 619-622, issn 0368-4466Conference Paper

GaPO₄ high temperature crystal microbalance demonstration up to 720°CTHANNER, H; KREMPL, P. W; SELIC, R et al.Journal of thermal analysis and calorimetry. 2003, Vol 71, Num 1, pp 53-59, issn 1388-6150, 7 p.Conference Paper

The damping of balancesGAST, T; JENEMANN, H. R; ROBENS, E et al.Journal of thermal analysis and calorimetry. 1999, Vol 55, Num 2, pp 347-355, issn 1388-6150Conference Paper

Chemical sensitivity of the thickness-shear-mode quartz-resonator nanobalanceIVANOV, D. V; YELON, A.Journal of the Electrochemical Society. 1996, Vol 143, Num 9, pp 2835-2841, issn 0013-4651Article

Restoring of a balance by electric pulsesPOULIS, J. A; ROBENS, E; MASSEN, C. H et al.Journal of thermal analysis and calorimetry. 2004, Vol 76, Num 2, pp 575-578, issn 1388-6150, 4 p.Conference Paper

EQCM with air-gap excitation electrode. Calibration tests with copper and oxygen coatingsBUCUR, R. V; MECEA, V. M; CARLSSON, J.-O et al.Electrochimica acta. 2003, Vol 48, Num 23, pp 3431-3438, issn 0013-4686, 8 p.Article

Stress sensitivity distribution measurement using a low-frequency sound wave and its application to quartz crystal microbalancesGOKA, S; WATANABE, Y; SEKIMOTO, H et al.Japanese journal of applied physics. 1997, Vol 36, Num 5B, pp 3178-3179, issn 0021-4922, 1Conference Paper

The Q-factor of flexure membranesBAKER, M; JU, L; BLAIR, D. G et al.Measurement science & technology (Print). 2001, Vol 12, Num 10, pp 1666-1671, issn 0957-0233Article

Effect of final drawing with light reduction on the levelling of residual stress distribution in cold bar drawingKUBOKI, T; AKIYAMA, M; NEISHI, Y et al.Proceedings of the Institution of Mechanical Engineers. Part C, Journal of mechanical engineering science. 2000, Vol 214, Num 11, pp 1389-1400, issn 0954-4062Article

Neutron stress measurement of W-fiber reinforced Cu compositeNISHIDA, M; HANABUSA, T; IKEUCHI, Y et al.Materialwissenschaft und Werkstofftechnik. 2003, Vol 34, Num 1, pp 49-55, issn 0933-5137, 7 p.Article

Contactless measurement of bolt axial stress using a shear-wave electromagnetic acoustic transducerHIRAO, M; OGI, H; YASUI, H et al.NDT & E international. 2001, Vol 34, Num 3, pp 179-183, issn 0963-8695Conference Paper

Network-level pavement deflection testing and structural evaluationHOSSAIN, M; CHOWDHURY, T; CHITRAPU, S et al.Journal of testing and evaluation. 2000, Vol 28, Num 3, pp 199-206, issn 0090-3973Article

The capacitive drop tensiometer: a novel multianalysing technique for measuring the properties of liquidsWANG, C. H; AUGOUSTI, A. T; MASON, J et al.Measurement science & technology (Print). 1999, Vol 10, Num 1, pp 19-24, issn 0957-0233Article

Frequency interference between two quartz crystal microbalancesSHEN, Feng; KWOK HONG LEE; O'SHEA, Sean J et al.IEEE sensors journal. 2003, Vol 3, Num 3, pp 274-281, issn 1530-437X, 8 p.Article

Quasi-static bending test of nano-scale SiO₂ wire at intermediate temperatures using AFM-based techniqueNAMAZU, Takahiro; ISONO, Yoshitada.Sensors and actuators. A, Physical. 2003, Vol 104, Num 1, pp 78-85, issn 0924-4247, 8 p.Article

Tensile testing of SiO₂ and Si₃N₄ films carried out on a silicon chipYOSHIOKA, T; ANDO, T; SHIKIDA, M et al.Sensors and actuators. A, Physical. 2000, Vol 82, Num 1-3, pp 291-296, issn 0924-4247Article

The strength of surface micromachined indium phosphide devices evaluated by Weibull analysis of tensile and bending testsGREEK, S; SEASSAL, C; VIKTOROVITCH, P et al.Sensors and materials. 1999, Vol 11, Num 4, pp 247-256, issn 0914-4935Article

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Glass capillaries as primary optics for X-ray stress analysisGIBMEIER, J; SCHOLTES, B.Materialwissenschaft und Werkstofftechnik. 2003, Vol 34, Num 1, pp 115-119, issn 0933-5137, 5 p.Article

Sources of error in sorption and density measurementsROBENS, E; KELLER, J. U; MASSEN, C. H et al.Journal of thermal analysis and calorimetry. 1999, Vol 55, Num 2, pp 383-387, issn 1388-6150Conference Paper